K. Bharath Kumar,
- Formerly Researcher, Oki Electric Company, R&D Division, Tokyo, Japan
Abstract
A time-domain method for certain types of excitations is proposed to determine Thevenin equivalent circuit for a circuit with resistors and dependent/independent sources. SPICE/Pspice model descriptions for resistors at constant temperature and dependent source are used. Instead of making the energy sources zero (as in frequency domain) the sources in time domain are described using model description cards available for time-domain current/voltage sources at the same time evaluating circuit for the waveforms described using built-in model cards. Further, the energy sources can be circulated, i.e. replace one with the other and obtain same Thevenin resistance. Also. different values for current/voltage can be given. The presented technic can be applied to networks with (a) resistor in series with parallel combination of three (or many) resistors (b) resistors in series with a parallel combination of a resistor, resistor parallel resistors, using analog behavior options available in PSpice software. Time-domain sources such as Pulse and PWL (both current/voltage) are used. Examples to obtain Thevenin resistance for a circuit is given and verified with SPICE transfer function ( TF command) to calculate DC output resistance. A theoretical network is considered as an example to implement a Thevenin resistance of another independent network in the time domain, in the required chosen time. This circuit with Thevenin resistance is simulated and the results are verified. The presented procedure can be used in three techniques to obtain DC Thevenin network parameters, other than usual transfer function (TF).
Keywords: printed circuit boards , digital signal, analog signal
[This article belongs to Journal of Semiconductor Devices and Circuits ]
K. Bharath Kumar. Three Techniques for DC Thevenin Resistance Using Pspice Simulation. Journal of Semiconductor Devices and Circuits. 2025; 12(01):1-8.
K. Bharath Kumar. Three Techniques for DC Thevenin Resistance Using Pspice Simulation. Journal of Semiconductor Devices and Circuits. 2025; 12(01):1-8. Available from: https://journals.stmjournals.com/josdc/article=2025/view=197510
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Journal of Semiconductor Devices and Circuits
| Volume | 12 |
| Issue | 01 |
| Received | 27/12/2024 |
| Accepted | 15/01/2025 |
| Published | 08/02/2025 |
| Publication Time | 43 Days |
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