An Integrated Simulation Framework for Predicting Dielectric Breakdown and Electrical Aging in Epoxy-Silica Composite Insulation Systems

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Year : 2026 | Volume : 14 | 01 | Page :
    By

    Digvijay B Kanase,

  • Arun Thorat,

  • Swapnil Patil,

  • Suraj Pawar,

  • Sachin P Jadhav,

  • Vishal Patil,

  1. Assistant Professor, Department of Electrical Engineering, Dr. D. Y. Patil Institute of Technology, Pimpri, Pune, Maharashtra, India
  2. Associate Professor, Department of Electrical Engineering, Rajarambapu Institute of Technology Islampur, Maharashtra, India
  3. Assistant Professor, Department of Electrical Engineering, Walchand College of Engineering, Sangli, Maharashtra, India
  4. Assistant Professor, Department of Electrical Engineering, Annasaheb Dange College of Engineering and Technology, Maharashtra, India
  5. Assistant Professor, Department of Electrical Engineering, Rajarambapu Institute of Technology Islampur, Maharashtra, India
  6. Assistant Professor, Department of Electrical Engineering, Rajarambapu Institute of Technology Islampur, Maharashtra, India

Abstract

This paper provides a combined computation approach in forecasting the dielectric breakdown and electrical aging within epoxy-silica composite of insulation system. The approach will consist of a three-complementary methodology (a combination of computing electric field using the finite element analysis, estimation of the probability of failures or breakdowns using Weibull statistics, and prediction of degradation tendencies using artificial neural networks). The epoxy-silica composites are of 10-40 volumes fillers. The simulations include both electrical and thermal stresses which have field strengths of 8-25 kV/mm together with temperatures of 300-340 K keeping in mind the aging mechanisms of up to 30,000 hours. Findings indicate local field enhancement of 24.7% at filler-matrix interfaces indicating the need of field examination in designing insulation properly. The voltage endurance coefficient is 7.2 showing great sensitivity to electrical stress. Maximum filler amount of 28.6% will provide an 32.5% longer life of insulation than unfilled epoxy. The root mean square error of the artificial neural network in predicting breakdown strength is 0.047 kV/mm which is a 42% reduction over the traditional linear regression. The means and B10 of design conditions of the reliability analysis are 40.9 years and 27.7 years, respectively which can be useful in insulation optimization, conditions estimation and remaining life estimation in high voltage equipment.

Keywords: Epoxy-silica composites, dielectric breakdown, electrical aging, finite element analysis, artificial neural networks, insulation reliability, Weibull statistics

How to cite this article:
Digvijay B Kanase, Arun Thorat, Swapnil Patil, Suraj Pawar, Sachin P Jadhav, Vishal Patil. An Integrated Simulation Framework for Predicting Dielectric Breakdown and Electrical Aging in Epoxy-Silica Composite Insulation Systems. Journal of Polymer & Composites. 2026; 14(01):-.
How to cite this URL:
Digvijay B Kanase, Arun Thorat, Swapnil Patil, Suraj Pawar, Sachin P Jadhav, Vishal Patil. An Integrated Simulation Framework for Predicting Dielectric Breakdown and Electrical Aging in Epoxy-Silica Composite Insulation Systems. Journal of Polymer & Composites. 2026; 14(01):-. Available from: https://journals.stmjournals.com/jopc/article=2026/view=239811


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Ahead of Print Subscription Review Article
Volume 14
01
Received 05/03/2026
Accepted 21/03/2026
Published 07/04/2026
Publication Time 33 Days
33

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