IJVCDT Volume: 03, Issue: 01 Year: 2025


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Editor Overview

ijvcdt maintains an Editorial Board of practicing researchers from around the world, to ensure manuscripts are handled by editors who are experts in the field of study.

Prof. Shyam Akashe

Prof. Shyam Akashe

Professor and Dean ICP
ITM University Gwalior, Madhya Pradesh, India 474001
Editor in Chief
International Journal of VLSI Circuit Design & Technology
Email :

Institutional Profile Link : https://itmuniversity.ac.in/

Publisher

STM Journals, An imprint of Consortium e-Learning Network Pvt. Ltd.

E-mail: [email protected]
Tel: (+91) 0120- 4781 200, (+91) 9218093691
Mob: (+91) 981-007-8958, (+91)-966-7725-932

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Regular Issue  Subscription Original Research Published on :- Apr 02, 2025
By  

 

Srivinesh M, Aaron Jebakumar P, Apshara T, Arjun K,
Abstract : The proposal is for a lightweight, multi-mode, reconfigurable authenticated encryption system with associated data (AEADs) based on AES. It is read more

[This section belongs to International Journal of VLSI Circuit Design & Technology (ijvcdt)]

 

 

54-68
Regular Issue  Subscription Review Article Published on :- Apr 09, 2025
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V. Basil Hans,
Abstract : The evolution of Very Large-Scale Integration (VLSI) technology has significantly transformed the landscape of modern electronics, driving innovations read more

[This section belongs to International Journal of VLSI Circuit Design & Technology (ijvcdt)]

 

 

1-8
Regular Issue  Subscription Original Research Published on :- Apr 09, 2025
By  

 

K Kazi, Sayyad Liyakat,
Abstract : The proliferation of Internet of Things (IoT) devices has brought unparalleled connectivity and convenience. However, this increased connectivity read more

[This section belongs to International Journal of VLSI Circuit Design & Technology (ijvcdt)]

 

 

19-28
Regular Issue  Subscription Review Article Published on :- Apr 09, 2025
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Mulla Nikat, Kazi Kutubuddin,
Abstract : The Internet of Things (IoT) has revolutionized connectivity by integrating billions of devices and reshaping industries. However, this vast network read more

[This section belongs to International Journal of VLSI Circuit Design & Technology (ijvcdt)]

 

 

29-40
Regular Issue  Subscription Original Research Published on :- Apr 09, 2025
By  

 

Hemapriya C, Sananda S, Sneha M., Suryakala S,
Abstract : The in-situ EDAC architecture is normally hired in timing-error tolerant circuits in a try and decrease the conservative timing protect band due to read more

[This section belongs to International Journal of VLSI Circuit Design & Technology (ijvcdt)]

 

 

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